Measurement of Low-Permittivity Materials Based on a Spectral-Domain Analysis for the Open-ended Coaxial Probe

IEEE Transactions on Instrumentation and Measurement

Volumn 42, Issue 5, 1993, Pages 879-886

  Langhe, Pascal De ^a   Blomme, Krist ^a   Martens, Luc ^a   Zutter, Daniel De ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PERTURBATION TECHNIQUES; PROBES; SIMULATION;

CLOSED FORM EXPRESSION; COAXIAL PROBE; PLANAR STRATIFIED MATERIAL; SPECTRAL DOMAIN ANALYSIS;

DIELECTRIC MATERIALS;

EID: 0027680570     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.252521     Document Type: Article

References (14)

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