Scanning thermal microscopy at nanometer scales: A new frontier in experimental heat transfer

Experimental Heat Transfer

Volumn 9, Issue 2, 1996, Pages 83-103

  Majumdar, A ^a   Luo, K ^a   Shi, Z ^a   Varesi, J ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS;

SCANNING THERMAL MICROSCOPY; VERTICAL CAVITY SURFACE EMITTING QUANTUM WELL LASERS;

HEAT TRANSFER;

EID: 0030114311     PISSN: 08916152     EISSN: 15210480     Source Type: Journal    
DOI: 10.1080/08916159608946516     Document Type: Article

References (40)

1. J. W. Valvano, Temperature Measurements, in Y. I. Cho (ed.), Advances in Heat Transfer, vol. 22, pp. 359-436, 1992.
2. K. Goodson, O. W. Kading, M. Rosier, and R. Zachai, Experimental Investigation of Thermal Conduction Normal to Diamond-Silicon Boundaries, Appl. Phys., vol. 77, pp. 1385-1392, 1995.
3. S. Heng and W. Z. Black, Temperature Mapping of Localized Hot Spots on Microelectronic Chip Surfaces, ASME J. Electronic Packaging, vol. 113, pp. 286-293, 1991.
4. T. Q. Qiu, C. Grigoropoulos, and C. L. Tien, Novel Technique for Noncontact and Microscale Temperature Measurements, Exp. Heat Transfer, vol. 6, pp. 231-234, 1993.
5. K.-L. K. Liu, K. L. Davis, and M. D. Morris, Raman Spectroscopic Measurement of Spatial and Temporal Temperature Gradients in Operating Electrophoresis Capillaries, Anal. Chem., vol. 66, pp. 3744-3750, 1994.
6. R. Ostermeir, K. Brunner, G. Abstreiter, and W. Weber, Temperature Distribution in Si-MOSFETs Studied by Micro Raman Spectroscopy, IEEE Trans. Electronic Devices, vol. 39, pp. 858-863, 1992.
7. K. Azar, J. R. Benson, and V. P. Manno, Liquid Crystal Imaging for Temperature Measurement of Electronic Devices, IEEE 7th Annual Semiconductor Thermal Measurement & Management Symp., pp. 23-29, 1991.
8. S. J. Doran, T. A. Carpenter, and L. D. Hall, Noninvasive measurement of temperature distributions with high spatial resolution using quantitative NMR relaxation times, Rev. Sci. Instrum., vol. 65, pp. 2231-2237, 1994.
9. L. Spassov, D. Y. Yankov, V. Georgiev, E. Yossifov, and L. Vergov, A Thermosensitive Quartz Resonator with a Built-in Microheater as a Multipurpose Sensor, Rev. Sci. Instrum., vol. 66, pp. 168-170, 1995.
10. Betzig, J., K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Breaking the Diffraction Barrier: Optical Microscopy on a Nanometer Scale, Science, vol. 251, pp. 1468-1470, 1991.
11. Zenhausern, Y. Martin, and H. K. Wickramasinghe, Scanning Interferometric Aper- tureless Microscopy: Optical Imaging at 10 Angstrom Resolution, Science, vol. 269, pp. 1083-1085, 1995.
12. D. Rugar, C. S. Yannoni, and J. A. Sidles, Mechanical Detection of Magnetic Resonance, Nature, vol. 360, pp. 563-566, 1992.
13. Binnig, C., F. Quate, and Ch. Gerber, Atomic Force Microscope, Phys. Rev. Lett., vol. 56, pp. 930-933, 1986.
14. D. Rugar and P. K. Hansma, Atomic Force Microscopy, Phys. Today, pp. 23-30, October 1990.
15. F. Ohnesorge and G. Binnig, True Atomic Resolution by Atomic Force Microscopy through Repulsive and Attractive Forces, Science, vol. 260, pp. 1451-1454, 1993.
16. G. Hansma, J. Vesenka, C. Siegerist, G. Kelderman, H. Morrett, R. L. Sinsheimer, V. Elings, C. Bustamante, and P. K. Hansma, Reproducible Imaging and Dissection of Plasmid DNA under Liquid with the Atomic Force Microscope, Science, vol. 256, pp. 1180-1184, 1992.
17. C. C. Williams and H. K. Wickramasinghe, Scanning Thermal Profiler, Appl. Phys. Lett., vol. 49, 1587-1589, 1986.
18. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Surface Studies by Scanning Tunneling Microscopy, Phys. Rev. Lett., vol. 49, pp. 57-61, 1982.
19. M. Nonenmacher and H. K. Wickramasinghe, Scanning Probe Microscopy of Thermal Conductivity and Sub-surface Properties, Appl. Phys. Lett., vol. 61, pp. 168-170, 1992.
20. A Majumdar, J. P. Carrejo, and J. Lai, Thermal Imaging Using the Atomic Force Microscope, Appl. Phys. Lett., vol. 62, pp. 2501-2503, 1993.
21. R. J. Pylkki, P. J. Moyer, and P. E. West, Scanning near-field optical and scanning thermal microscopy, Jpn. J. Appl. Phys., Part I, vol. 33, pp. 3785-3790, 1994.
22. A Hammiche, D. J. Hourston, H. M. Pollock, M. Reading, and M. Song, Scanning Thermal Microscopy: Sub-surface Imaging, Thermal Mapping of Polymer Blends, Localized Calorimetry, submitted for publication.
23. Majumdar, J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi, Thermal Imaging by Atomic Force Microscopy Using Thermocouple Cantilever Probes, Rev. Sci. Instrum., vol. 66, pp. 3584-3592, 1995.
24. J. Lai, M. Chandrachood, A. Majumdar, and J. P. Carrejo, Thermal Detection of Device Failure by Atomic Force Microscopy, IEEE Electron Deuice Lett, vol. 16, pp. 312-315, 1995.
25. K. Luo, Z. Shi, J. Lai, and A. Majumdar, Nanofabrication of Sensors on Cantilever Probe Tips for Scanning Multi-Probe Microscopy, Appl. Phys. Lett., vol. 68, pp. 325-327, 1996.
26. K. Luo, Z. Shi, and A. Majumdar, Nanofabrication and Performance of Cantilever Thermocouple Probes for Scanning Thermal Microscopy, submitted for publication.
27. H. N. Bertram, Theory of Magnetic Recording, Cambridge University Press, Cambridge, 1994.
28. D. Hannon and M. Krounbi, Allicat Magnetoresistive Head Design and Performance, IEEE Trans. Magnetics, vol. 30, pp. 298-302, 1994.
29. F. Incropera and D. P. DeWitt, Fundamentals of Heat and Mass Transfer, 3d ed., John Wiley, New York, 1990.
30. G. Chen, A Comparative Study on the Thermal Characteristics of Vertical-Cavity Surface-Emitting Lasers, J. Appl. Phys., vol. 77, pp. 4251-4258, 1995.
31. W Nakwaski and M. Osinki, Thermal Properties of Etched-Well Surface Emitting Semiconductor Lasers, IEEEJ. Quantum Electron., vol. 27, pp. 1391-1401, 1991.
32. R. Michalzik and K. J. Ebeling, Modeling and Design of Proton-Implanted Ultra-Low Threshold Vertical Cavity Laser Diodes, IEEE J. Quantum Electron., vol. 29, pp. 1963-1974, 1993.
33. J. Piprek, H. Wenzel, and S. J. B. Sztefka, Modeling Thermal Effects on the Light vs Current Characteristic of Gain Guided Vertical Cavity Surface Emitting Lasers, IEEE Photonics Technol. Lett., vol. 6, pp. 139-142, 1994.
34. D. Vakhshoori, J. D. Wynn, G. J. Zydzik, R. E. Leibenguth, M. T. Asom, K. Kojima, and R. A. Morgan, Top-Surface Emitting Lasers with 1.9 V Threshold Voltage and the Effect of Spatial Hole Burning on Their Transverse Mode Operation and Efficiencies, Appl. Phys. Lett., vol. 62, pp. 1448-1450, 1993
35. M. A. Rahman, S. P. Lepkowski, and K. T. V. Grattan, Thermal Modeling of Vertical-Cavity Surface-Emitting Lasers Using the Finite Element Method, IEEE Proc. Optoelectron., vol. 142, pp. 82-86, 1995.
36. G. Hasnain, K Tai, L. Yang, Y. H. Wang, R. J. Fisher, J D. Wynn, B. Weir, N K. Dutta, and A. Y. Cho, Performance of Gain-Guided Surface Emitting Lasers with Semiconductor Distributed Bragg Reflectors, IEEE J. Quantum Electron., vol. 27, pp. 1377-1385, 1991.
37. G. Chen, M. A. Hadley, and J S. Smith, Pulsed and Continuous-Wave Thermal Characteristics of External-Cavity Surface Emitting Laser Diodes, J. Appl. Phys., vol. 76, pp. 3261-3271, 1994.
38. D B. Young, J. W. Scott, F. H. Peters, M. G. Peters, M. L. Makewski, B. J. Thibeault, S. W. Corzine, and L. A. Coldren, Enhanced Performance of Offset-Gain High-Barrier Vertical Cavity Surface Emitting Lasers, IEEE J. Quantum Electron., vol. 29, pp. 2013-2022, 1993.
39. N K. Dutta, L. W. Tu, G. Hasnain, G. Zydzik, Y. H Wang, and A. Y. Cho, Anomalous Temporal Response of Gain-Guided Surface Emitting Lasers, Electron. Lett., vol. 27, pp. 208-210, 1991.
40. H. Hansma, Atomic Force Microscopy of Biomolecules, STM95 Int. Conf.; J. Vacuum Sci. Technol., in press.