Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1639, Issue , 1992, Pages 36-43

  Hulst, Niek F ^a   Moers, M H ^a   Noordman, O F ^a   Faulkner, T ^a   Segerink, F B ^a   Werf, Kees O ^a   Grooth, Bart G ^a   Bolger, Bouwe ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LIGHT - REFLECTION; OPTICAL FIBERS;

FIBER PROBE; INVERTED LIGHT MICROSCOPE; SCANNING FORCE MICROSCOPE; SCANNING NEAR FIELD OPTICAL MICROSCOPE;

MICROSCOPES;

EID: 0026487425     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)