Solving ml equations for 2-parameter poisson-process models for ungrouped software-failure data

IEEE Transactions on Reliability

Volumn 45, Issue 1, 1996, Pages 42-53

  Knafl, George J ^a   Morgan, Joseph ^a  

^a DEPAUL UNIVERSITY   (United States)

Author keywords

Maximum likelihood estimation; Nonhomogeneous poissonprocess; Reliability growth modeling; Software reliability; Ungrouped failure data

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; RELIABILITY;

MAXIMUM LIKELIHOOD ESTIMATION; NONHOMOGENEOUS POISSON PROCESS; RELIABILITY GROWTH MODELING;

COMPUTER SOFTWARE;

EID: 0030110130     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.488915     Document Type: Article

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