Software Reliability Growth Modeling: Models and Applications

IEEE Transactions on Software Engineering

Volumn SE-11, Issue 12, 1985, Pages 1431-1437

  Yamada, Shigeru ^a   Osaki, Shunji ^b  

^a OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Error detection rate per error; maximum likelihood estimation; nonhomogeneous Poisson processes; software error; software reliability analysis; software reliability growth models

Indexed keywords

PROBABILITY;

MAXIMUM-LIKELIHOOD ESTIMATION; POISSON PROCESSES;

COMPUTER SOFTWARE;

EID: 0022224726     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.1985.232179     Document Type: Article

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