Measurement of interdiffusion in II-VI quantum-well structures using optical methods

Journal of Applied Physics

Volumn 79, Issue 4, 1996, Pages 1895-1897

  Karla, I ^a   Shaw, D ^a   Hagston, W E ^a   Hogg, J H C ^a   Chalk, S ^a   Nicholls, J E ^a   Peili, C ^a  

^a UNIVERSITY OF HULL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CALCULATIONS; ELECTRON ENERGY LEVELS; INTERDIFFUSION (SOLIDS); IONS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; X RAY CRYSTALLOGRAPHY;

CADMIUM MANGANESE TELLURIDE; CADMIUM TELLURIDE; CATION VACANCY; DOUBLE CRYSTAL X RAY DIFFRACTION; PHOTOLUMINESCENCE EXCITATION;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0030085898     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361092     Document Type: Article

References (19)

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