Monitoring of intermixing and interdiffusion by x-ray diffraction of ion-implanted quantum-well structures

Journal of Applied Physics

Volumn 79, Issue 4, 1996, Pages 1898-1902

  Karla, I ^a   Hogg, J H C ^a   Hagston, W E ^a   Fatah, J ^a   Shaw, D ^a  

^a UNIVERSITY OF HULL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; CALCULATIONS; CRYSTAL DEFECTS; INTERDIFFUSION (SOLIDS); ION IMPLANTATION; MOLECULAR BEAM EPITAXY; SEMICONDUCTING CADMIUM COMPOUNDS; SUPERLATTICES;

CADMIUM MANGANESE TELLURIDE; CADMIUM TELLURIDE; INTERMIXING; LATTICE DISORDER; X RAY ROCKING CURVE;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0030081509     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361093     Document Type: Article

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