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Solid-State Electronics

Volumn 23, Issue 7, 1980, Pages 783-792

Ramp recovery in p-i-n diodes

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DIODES;

EID: 0019035358 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1101(80)90137-9 Document Type: Article

Times cited : (17)

References (9)

1
- 0018547437
- (1979) Solid-St. Electron. , vol.22 , pp. 927
- Berz, F.¹

2
- 0014851945
- Correlations between reverse recovery time and lifetime of p-n junction driven by a current ramp
- (1970) IEEE Transactions on Electron Devices , vol.17 ED , pp. 652
- Kao, Y.C.¹ Davis, J.R.²

3
- 85025748794
- (AEG Telefunken) 76-64 (Research Report), Bundesministerium für Forschung und Technologie
- (1976) Forschungbericht T
- Borchert, E.¹

4
- 84936896634
- Reverse recovery processes in silicon power rectifiers
- (1967) Proceedings of the IEEE , vol.55 , pp. 1331
- Benda, H.¹ Spenke, E.²

5
- 0015481178
- (1972) Phys. Stat. Sol. (a) , vol.14 , pp. 695
- Aronov, D.A.¹ Mamatkulov, R.²

6
- 85025747500
- McGraw-Hill, New York
- (1953) Transcendental Functions , vol.2 , pp. 254
- Erdelyi, A.¹ Magnus, W.² Oberhettinger, F.³ Tricomi, F.G.⁴

7
- 84917989423
- McGraw-Hill, New York
- (1954) Tables of Integral Transforms , vol.1 , pp. 258
- Erdelyi, A.¹ Oberhettinger, W.² Tricomi, F.G.³

8
- 17544373064
- Switching Time in Junction Diodes and Junction Transistors
- (1954) Proceedings of the IRE , vol.42 , pp. 829
- Kingston, R.H.¹

9
- 0003498504
- Academic Press, New York
- (1965) Tables of Integrals, Series and Products , pp. 638
- Gradshteyn, I.S.¹ Ryzhik, I.W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.