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Volumn 11, Issue 1, 1996, Pages 68-73

Manifestation of effective-mass states of secondary minima in the persistent photoconductivity related to the DX centre in AlxGa1-xAs

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; FERMI LEVEL; LOW TEMPERATURE PHENOMENA; PARAMAGNETIC RESONANCE; PHOTOCONDUCTIVITY; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DOPING;

EID: 0029755848     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/1/016     Document Type: Article
Times cited : (4)

References (41)
  • 2
    • 85083138727 scopus 로고
    • For a recent review, see Proc. Int. Symp. on DX Centers and other Metastable Qefects in Semiconductors (Mauterndorf, 1991) 1991 Semicond. Sci. Technol. 6 B1-B155
    • (1991) Semicond. Sci. Technol. , vol.6
  • 10
    • 0026237683 scopus 로고    scopus 로고
    • Von Bardeleben H J 1991 Proc. Int. Symp. on DX Centers and other Metastable Defects in Semiconductors (Mauterndorf, 1991); Semicond. Sci. Technol. 6 B105
    • Semicond. Sci. Technol. , vol.6
  • 14
    • 0026239231 scopus 로고    scopus 로고
    • Fockele M, Spaeth J M, Overhof H and Gibart P 1991 Proc. Int. Symp. on DX Centers and other Metastable Defects in Semiconductors (Mauterndorf, 1991); Semicond. Sci. Technol. 6 B88
    • Semicond. Sci. Technol. , vol.6
  • 18
    • 85083149306 scopus 로고    scopus 로고
    • Barraldi A, Ghezzi C, Parisini A, Bosacchi A and Franchi S 1991 Proc. Int. Symp. on DX Centers and other Metastable Defects in Semiconductors (Mauterndorf, 1991); Semicond. Sci. Technol. 6 B27
    • Semicond. Sci. Technol. , vol.6
  • 37
    • 85083121782 scopus 로고
    • PhD Thesis Institute of Semiconductors, Kiev
    • Raychev O E 1992 PhD Thesis Institute of Semiconductors, Kiev
    • (1992)
    • Raychev, O.E.1
  • 40
    • 0026239064 scopus 로고    scopus 로고
    • Wilamowski Z, Kossut J, Jantsch W and Ostermayer G 1991 Proc. Int. Symp. on DX Centers and other Metastable Defects in Semiconductors (Mauterndorf, 1991); Semicond. Sci. Technol. 6 B38
    • Semicond. Sci. Technol. , vol.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.