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Volumn 68, Issue 3, 1996, Pages 370-372

Low resistance graded contacts to n-type ZnSe

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BINDING ENERGY; CHLORINE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; FERMI LEVEL; MATHEMATICAL MODELS; OHMIC CONTACTS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING;

EID: 0029752506     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116719     Document Type: Article
Times cited : (6)

References (10)
  • 1
    • 21544473235 scopus 로고    scopus 로고
    • See for example, II-VI Blue/Green Laser Diodes, edited by R. L. Gunshor and A. V. Nurmikko, Proc. SPIE 2346 (1994)
    • See for example, II-VI Blue/Green Laser Diodes, edited by R. L. Gunshor and A. V. Nurmikko, Proc. SPIE 2346 (1994).
  • 2
    • 0000610960 scopus 로고    scopus 로고
    • R. G. Dandrea and B. Duke, Appl. Phys. Lett. 64, 2145 (1994) and references therein
    • R. G. Dandrea and B. Duke, Appl. Phys. Lett. 64, 2145 (1994) and references therein.
  • 4
    • 21544461328 scopus 로고    scopus 로고
    • More detail will be provided elsewhere: G. Bratina, T. Ozzello, M. Lazzarino, L. Vanzetti, J. J. Paggel, L. Sorba, A. Franciosi, and M. Peressi (unpublished)
    • More detail will be provided elsewhere: G. Bratina, T. Ozzello, M. Lazzarino, L. Vanzetti, J. J. Paggel, L. Sorba, A. Franciosi, and M. Peressi (unpublished).
  • 5
    • 36449007407 scopus 로고    scopus 로고
    • xSe)=(1-x)2.76+x1.66-0.301x(1-x)
    • xSe)=(1-x)2.76+x1.66-0.301x(1-x).
  • 6
    • 21544461606 scopus 로고    scopus 로고
    • pb0∼2.0-2.1 eV. See M. Vos, F. Xu, S. G. Anderson, J. H. Weaver, and H. Cheng, Phys. Rev. B 39, 10744 (1989) and W. Chen, A. Kahn, P. Soukiassian, P. S. Mangat, J. Gaines, C. Ponzoni, and D. Olego, J. Vac. Sci. Technol. B 12, 2639 (1994)
    • pb0∼2.0-2.1 eV. See M. Vos, F. Xu, S. G. Anderson, J. H. Weaver, and H. Cheng, Phys. Rev. B 39, 10744 (1989) and W. Chen, A. Kahn, P. Soukiassian, P. S. Mangat, J. Gaines, C. Ponzoni, and D. Olego, J. Vac. Sci. Technol. B 12, 2639 (1994).
  • 7
    • 0028760570 scopus 로고
    • The present results were obtained on Se-rich surfaces, as opposed to the Zn-stabilized c(2×2) surfaces used by other authors (see Ref. 6). Variations of ∼0.25 eV in the Schottky barrier have been recently observed in comparing Au/ZnSe(001) junctions fabricated on Zn-rich and Se-rich surfaces. See
    • The present results were obtained on Se-rich surfaces, as opposed to the Zn-stabilized c(2×2) surfaces used by other authors (see Ref. 6). Variations of ∼0.25 eV in the Schottky barrier have been recently observed in comparing Au/ZnSe(001) junctions fabricated on Zn-rich and Se-rich surfaces. See W. Chen, J. Gaines, C. Ponzoni, D. Olego, P. S. Mangat, P. Soukiassian, and A. Kahn, J. Cryst. Growth 138, 1078 (1994).
    • (1994) J. Cryst. Growth , vol.138 , pp. 1078
    • Chen, W.1    Gaines, J.2    Ponzoni, C.3    Olego, D.4    Mangat, P.S.5    Soukiassian, P.6    Kahn, A.7
  • 10
    • 21544482371 scopus 로고    scopus 로고
    • S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981)
    • S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.