Fault Coverage and Test Length Estimation for Random Pattern Testing

IEEE Transactions on Computers

Volumn 44, Issue 2, 1995, Pages 234-247

  Majumdar, Amitava ^a   Vrudhula, Sarma B K ^b  

^a CrossCheck Technology Inc   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT COVERAGE; OCCUPANCY; TEST LENGTH; URN MODELS; WAITING TIME;

LOGIC CIRCUITS; RANDOM PROCESSES;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0029254427     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.364535     Document Type: Article

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