SAMPLING TECHNIQUES FOR DETERMINING FAULT COVERAGE IN LSI CIRCUITS.

Journal of Digital Systems

Volumn 5, Issue 3, 1981, Pages 189-202

  Agrawal, Vishwani D ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - LARGE SCALE INTERGRATION;

LOGIC CIRCUITS;

EID: 0019613185     PISSN: 01954350     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)