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Volumn 30, Issue 9, 1994, Pages 739-740

3.3 V operation GaAs power MESFETs with 65% power-added efficiency for hand-held telephones

Author keywords

MESFETs; Power transistors

Indexed keywords

COMMUNICATION CHANNELS (INFORMATION THEORY); CORDLESS TELEPHONES; EFFICIENCY; EPITAXIAL GROWTH; GATES (TRANSISTOR); RADIO TELEPHONE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0028413707     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19940477     Document Type: Article
Times cited : (10)

References (5)
  • 1
    • 0027277651 scopus 로고
    • Low voltage GaAs power amplifiers for personal communications at 1.9GHz
    • June
    • NGO, D., BECKWTTH, B., O'NEIL, P., and CAMILLERI, N.: ‘Low voltage GaAs power amplifiers for personal communications at 1.9GHz’. IEEE MTT-S Dig., June 1993, pp. 1461–1464
    • (1993) IEEE MTT-S Dig. , pp. 1461-1464
    • NGO, D.1    BECKWTTH, B.2    O'NEIL, P.3    CAMILLERI, N.4
  • 2
    • 0027307622 scopus 로고    scopus 로고
    • 3V operation L-band power double-doped heterojunction FETs
    • June
    • IWATA, N., INOSAKO, K., and KUZUHARA, M.; ‘3V operation L-band power double-doped heterojunction FETs’, IEEE MTT-S Dig., June 1993, pp. 1465–1468
    • IEEE MTT-S Dig. , pp. 1465-1468
    • IWATA, N.1    INOSAKO, K.2    KUZUHARA, M.3
  • 3
    • 0027617624 scopus 로고
    • A high power-added efficiency GaAs power MESFET and MMIC operating at a very low drain bias for use in personal handy phones
    • MURAI, S., SAWAI, T., YAMAGUCHI, T., and HARADA, Y.: ‘A high power-added efficiency GaAs power MESFET and MMIC operating at a very low drain bias for use in personal handy phones’, IEICE Trans.Electron, 1993, E76-C, pp. 901–907
    • (1993) IEICE Trans.Electron , vol.E76-C , pp. 901-907
    • MURAI, S.1    SAWAI, T.2    YAMAGUCHI, T.3    HARADA, Y.4
  • 5
    • 36449008809 scopus 로고
    • Improvement of breakdown characteristics of GaAs power FET using treatment
    • LEE, J.-L., KIM, D., MAENG, S.J., PARK, H.H., KANG, J.Y., and LEE, Y.T.; ‘Improvement of breakdown characteristics of GaAs power FET using treatment’, J. Appl. Phys., 1993, 73, pp. 3539–3524
    • (1993) J. Appl. Phys. , vol.73
    • LEE, J.-L.1    KIM, D.2    MAENG, S.J.3    PARK, H.H.4    KANG, J.Y.5    LEE, Y.T.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.