New time domain reflectometry techniques suitable for testing microwave and millimeter wave circuits

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1990, Pages 1045-1048

  Shen, Zhi Yuan ^a  

^a HYPRES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; MICROWAVE DEVICES--TESTING; MILLIMETER WAVES; SUPERCONDUCTING DEVICES;

ON-CHIP TESTS; TIME DOMAIN REFLECTOMETRY;

REFLECTOMETERS;

EID: 0025022859     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)