Test of SEU Algorithms Against Preliminary CRRES Satellite Data

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1642-1646

  Mullen, E G ^b   Ray, K P ^b   Abdel Kader, W G ^a   El Teleaty, S S ^a  

^a CLEMSON UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; SATELLITES; SEMICONDUCTOR DIODES, PHOTODIODE;

SINGLE EVENT UPSETS; SOFTWARE PACKAGE CUPID;

MICROELECTRONICS;

EID: 0026393367     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124157     Document Type: Article

References (6)

1. J.M. Bisgrove, J.E. Lynch, P. J. McNulty, W.G. Abdel Kader, V. Kletnieks, and W.A. Kolasinski, “Comparison of Soft Errors Induced by Heavy Ions and Protons”, IEEE Trans. Nucl. Sci. NS-33, 1571–1576, Dec. (1986).
2. E.G. Stassinopoulos, private communication
3. P.J. McNulty, G.E. Farrell, and W.P. Tucker, “Proton-Induced Induced Nuclear Reactions in Silicon”, IEEE Trans. Nucl. Sci. NS-28, 4007, (1981).
4. W. G. Abdel-Kader, P. J. McNulty, S. El-Teleaty, J. Lynch and A. N. Khondker, “Estimating the Dimensions of the SEU-Sensitive Sensitive Volume”, IEEE Trans. Nucl. Sci., NS-34, 1300, (1987).
5. P.J. McNulty, W.G. Abdel-Kader, and J.E. Lynch, “Modeling Charge Collection and Single Event Upsets in Microelectronics”, Nuclear Instruments and Methods in Physics Research B61, 52–60, (1991).
6. P.J. McNulty, W.J. Beauvais, D.R. Roth, J.E. Lynch, A. Knudson, and W. Stapor, “Microbeam Analysis of CMOS Circuits” to be published in IEEE RADECS proceedings Sept. 91.