Quantitative comparison of single event upsets induced by protons and neutrons

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1457-1462

  McNulty, Peter ^c   Abdel Kader, W G ^c   Yaktieen, M H ^c  

^a BOEING COMPANY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; MICROELECTRONICS; NEUTRONS; PROTONS;

SINGLE EVENT UPSETS;

SEMICONDUCTOR DEVICES;

EID: 0026372360     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124132     Document Type: Article

References (22)

1. J. L. Ziegler and W. A. Lanford, “Effect of Cosmic Rays on Computer Memories,” Science, 206, 776, Nov, 1979
2. C. S. Guenzer, E. A. Wolicki and R. G. Allas, “Single Event Upset of Dynamic RAMs by Neutrons and Protons,” IEEE Trans. Nucl. Sci., NS-26, 5048, 1979
3. C. H. Tsao, R. Silberberg and J. R. Letaw, “A Comparison of Neutron-Induced SEU Rates in Si and GaAs Devices,” IEEE Trans. Nucl. Sci., NS-35, 1634, 1988
4. R. Silberberg, C. H. Tsao and J. R. Letaw, “Neutron Generated Single Event Upsets in the Atmosphere,” IEEE Trans. Nucl. Sci., NS-31, 1183, 1984
5. G. E. Farrell and P. J. McNulty, “Microdosimetric Aspects of Proton-Induced Nuclear Reactions in Thin Layers of Silicon,” IEEE Trans. Nucl. Sci., NS-29, 2012, December, 1982
6. S. El Teleaty, G. E. Farrell and P. J. McNulty, “Charge-Deposition Deposition Spectra in Thin Slabs of Silicon Induced by Energetic Protons,” IEEE Trans. Nucl. Sci., NS-30, 4394, 1983
7. S. El Teleaty et al, “Soft Fails in Microelectronic Circuits due to Proton-Induced Nuclear Reactions in Material Surrounding the SEU-Sensitive Volume,” Nucl. Inst. Methods, B40, 1300 1989
8. E. Normand and W. R. Doherty, “Incorporation of ENDF-V Neutron Cross Section Data for Calculating Neutron-Induced Single Event Upsets,” IEEE Trans. Nucl. Sci., NS-36, 2349, 1989
9. W. J. Stapor et al., “Two Parameter Bendel Model Calculations for Predicting Proton Induced Upset,” IEEE Trans. Nucl. Sci., NS-37, 1966, 1990
10. E. Normand et al, “Use of PuBe Source to Simulate Neutron-Induced Single Event Upsets in Static RAMs,” IEEE Trans, Nucl. Sci., NS-35 1523, 1988
11. R. E. Morgan, “Neutron Induced Upset in the TMS 32020 and 320C25 Microprocessors,” Paper presented at the 7th SEE Symposium, Los Angeles, April, 1990
12. D. L. Oberg, W. R. Doherty, E. Normand and J. L. Wert, “Test Report for SEU and NSEU Upsets of IDT 7132/7142 Bulk Dual Port RAM and IDT 7130/7140 Epitaxial Dual Port RAM,” Boeing Report D180-317-74-1, September, 1989
13. J. Csikai, CR C Handbook of Fast Neutron Generators, Vol I, CRC Press, 1987
14. J. R. Letaw, “Burst Generation Rates in Silicon and Gallium Arsenide from Neutron-Induced Nuclear Recoils,” SCC Report 87-02, Severn Communications Corp, 1987
15. R. Kinsey, “ENDF-102, Data Formats and Procedures for the Evaluated Nuclear Data File, ENDF,” BNL-NCS-50496, Oct, 1979
16. D. I. Garber et al “Angular Distributions in Neutron-Induced Reactions, Volume I,” BNL 400, 1970
17. M. O. Burrell and J. J. Wright, “The Estimation of Galactic Cosmic Ray Penetration and Dose Rates,” NASA TN D-6600, March 1972
18. J. F. Ziegler, TRIM-90, “The Transport of Ions in Matter,” IBM Corporation, 1990
19. K. M. Murray, W. J. Stapor and C. Casteneda, “Calibrated Charged Particle Radiation System with Precision Dosimetric Measurement and Control,” Nucl. Instr. and Meth., A281, 616 (1989)
20. N. H. Kwong and J. Hufner, “The Energy Dependence of Nuclear Reaction Cross Sections,” Phys. Letters, 146B, 370, 1984
21. W. F. McGill et al, “Measurements of the Proton Total Reaction Cross Section for Light Nuclei Between 20 and 48 MeV,” Phys. Rev., C10, 2237, 1974
22. R. G. Alsmiller, Jr. et al, “Neutron-Photon Multigroup Cross Sections for Neutron Energies < 400 MeV,” ORNL/TM-9801, 1986