A Simple Estimate of Funneling-Assisted Charge Collection

IEEE Transactions on Nuclear Science

Volumn 38, Issue 2, 1991, Pages 828-833

  Edmonds, Larry D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; ELECTRIC MEASUREMENTS--CHARGE; MATHEMATICAL TECHNIQUES--NUMERICAL ANALYSIS;

SOFTWARE PACKAGE PISCES;

SEMICONDUCTOR DEVICES;

EID: 0026137972     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.289396     Document Type: Article

References (8)

1. C. Hu “Alpha-particle-induced field and enhanced collection of carriers,” IEEE Electron Device Lett., Vol. EDL-3, no. 2, pp. 31–34, Feb. 1982.
2. J. A. Zoutendyk, L. S. Smith, G. A. Soli, and R. Y. Lo, “Experimental evidence for a new single-event upset (SEU) mode in a CMOS SRAM obtained from model verification,” IEEE Trans. Nucl. Sci., vol. NS-34, no. 6, 1292–1299, Dec. 1987.
3. L. Edmonds, “An ohmic model for charge transport in a semiconductor,” Jet Propulsion Laboratory Publ. 90–47, Nov. 15, 1990.
4. F. B. McLean and T. R. Oldham, “Charge funneling in N-and P-type SI substrates,” IEEE Trans. Nucl. Sci., vol. NS-29, no. 6, pp. 2018–2023, Dec. 1982.
5. J. R. Hauser and P. M. Dunbar, “Minority carrier reflecting properties of semiconductor high-low junctions,” Solid-State vol. 715–716, 1975.
6. L. Edmonds “Charge collected by diffusion from an ion track under mixed boundary conditions,” IEEE Trans. Nucl. Sci., this issue, pp. 834–837.
7. P. M. Morse and H. Feshbach, Methods of Theoretical Physics, Part 1. New York: McGraw-Hill, 1953, 857–865.
8. Any Nuclear and Space Radiation Effects Conference Short Course.