Charge Collected by Diffusion from an Ion Track under Mixed Boundary Conditions

IEEE Transactions on Nuclear Science

Volumn 38, Issue 2, 1991, Pages 834-837

  Edmonds, Larry D ^a  

^a Institute of Technology ^*  (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; IONS--DIFFUSION; MATHEMATICAL TECHNIQUES--BOUNDARY VALUE PROBLEMS; SEMICONDUCTOR DEVICES--JUNCTIONS;

SOFTWARE PACKAGE PISCES;

SEMICONDUCTING SILICON;

EID: 0026139259     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.289397     Document Type: Article

References (4)

1. J. A. Zoutendyk, H. R. Schwartz, and L. R. Nevill, “Lateral charge transport from heavy-ion tracks in integrated circuit chips,” IEEE Trans. Nucl. Sci., vol. NS-35, no. 6, pp. 1644–1647, Dec. 1988.
2. G. Arfken, Mathematical Methods for Physicists. New York: Academic, 2nd ed., 1970, p. 760.
3. L. D. Edmonds, “A simple estimate of funneling assisted charge collection,” IEEE Trans. Nucl. Sci., vol. 38, no. 2, pp. xx-xx, Apr. 1991.
4. S. Kirkpatrick, “Modeling diffusion and collection of charge from ionizing radiation in silicon devices,” IEEE Trans. Electron Dev., vol. ED-26, no. 11, pp. 1742–1753, Nov. 1979.