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Volumn 32, Issue 3, 1985, Pages 658-661

The Hooge Parameters of n+-p-n and p+-n-p Silicon Bipolar Transistors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS - DIFFUSION; SEMICONDUCTING SILICON - APPLICATIONS;

EID: 0022024794     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.21994     Document Type: Article
Times cited : (28)

References (11)
  • 2
    • 0018989259 scopus 로고
    • 1/f noise in p-n diodes
    • T. G. M. Kleinpenning, “1/f noise in p-n diodes,” Physica B, vol. 98, p. 289, 1980
    • (1980) Physica B , vol.98 , pp. 289
    • Kleinpenning, T.G.M.1
  • 3
    • 0020090564 scopus 로고
    • Proposed discrimination between 1/f noise sources in transistors
    • A. van der Ziel, “Proposed discrimination between 1/ f noise sources in transistors,” Solid-State Electron., vol. 25, p. 141, 1982
    • (1982) Solid-State Electron , vol.25 , pp. 141
    • van der Ziel, A.1
  • 6
    • 0020547862 scopus 로고
    • Presence of mobility fluctuation 1/f noise identified in silicon p+-n-p transistors
    • J. Kilmer, A. van der Ziel, and G. Bosman, “Presence of mobility fluctuation 1/ f noise identified in silicon p+-n-p transistors,” Solid-State Electron., vol. 26, p. 71, 1983
    • (1983) Solid-State Electron , vol.26 , pp. 71
    • Kilmer, J.1    van der Ziel, A.2    Bosman, G.3
  • 11
    • 0001149533 scopus 로고
    • Lattice scattering causes 1/f noise
    • F. N. Hooge and L. K. J. Vandamme, “Lattice scattering causes 1/ f noise,” Phys. Lett., vol. 66A, p. 315, 1978
    • (1978) Phys. Lett , vol.66A , pp. 315
    • Hooge, F.N.1    Vandamme, L.K.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.