Functional Testing of Microprocessors

IEEE Transactions on Computers

Volumn C-33, Issue 6, 1984, Pages 475-485

  Brahme, Dhananjay ^a   Abraham, Jacob A ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS, MICROPROCESSOR;

EID: 0021439084     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1984.1676471     Document Type: Article

References (13)

1. M. A. Breuer and A. D. Friedman, Diagnosis and Reliable Design of Digital Systems. Rockville, MD: Computer Science, 1976.
2. R. L. Wadsack, “Fault modelling and logic simulation of CMOS and MOS integrated circuits,” Bell Syst. Tech. J., vol. 57, no. 5, pp. 1449–1474, May-June 1978.
3. R. Chandramouli, “On testing stuck-open faults,” in Proc. 1983 Fault-Tolerant Computing Symp., Milan, Italy, pp. 258–265.
4. J. Galiay, Y. Crouzet, and M. Vergniault, “Physical versus logical fault models MOS LSI circuits: Impact on their testability,” IEEE Trans. Comput., vol. C-29, pp. 527–531, June 1980.
5. P. Banerjee and J. Abraham, “Fault characterization of VLSI MOS circuits,” in IEEE Proc. 19821nt. Conf. Circuits Computers, pp. 564–568.
6. P. Thevenod-Fosse and R. David, “Random testing of the control section of a microprocessor,” in Proc. 1983 Fault-Tolerant Computing Symp., Milan, Italy, June, pp. 366–373.
7. S. M. Thatte and J. A. Abraham, “Test generation for microprocessors,” IEEE Trans. Comput., vol. C-29, pp. 429–441, June 1980.
8. C. Robach and G. Saucier, “Dynamic testing of control units,” IEEE Trans. Comput., vol. C-27, pp. 617–623, July 1978.
9. T. Sridhar and J. P. Hayes, “A functional approach to testing bit-sliced microprocessors,” IEEE Trans. Comput., vol. C-30, pp. 563–571, Aug. 1981.
10. A. A. Annaratone and M. G. Sami, “An approach to functional testing of microprocessors,” in Proc. 1982 Fault-Tolerant Computing Symp., Santa Monica, CA, June 1982, pp. 158–164.
11. S.M. Thatte, “Test generation for microprocessors,” Coord. Sci. Lab., Univ. Illinois, Urbana, Rep. R-842, May 1979.
12. J. Abraham and K. Parker, “Practical microprocessor testing: Open and closed loop approaches,” in Proc. COMPCON Spring 1981, San Francisco, CA, Feb. 1981, pp. 308–311.
13. J. P. Shen and M. A. Schuette, “On-line self-monitoring using signatured instruction streams,” in Proc. 1983 Int. Test Conf., Philadelphia, PA, Oct., pp. 275–282.