Design philosophy for high-resolution rate and throughput spectroscopy systems

IEEE Transactions on Nuclear Science

Volumn 30, Issue 1, 1983, Pages 301-310

  Goulding, F S ^a   Landis, D A ^a   Madden, N W ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROMETERS, X-RAY;

EID: 0020086920     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4332275     Document Type: Article

References (4)

1. F.S. Goulding, J.M. Jaklevic, B.V. Jarrett and D.A. Landis, Detector Background and Sensitivity, Advances in X-Ray Analysis, Vol. 15, 470 (Denver Conference, 1971).
2. D. Landis, C. Cork, N.W. Madden, F.S. Goulding, Transistor Reset Preamplifier for High Rate High Resolution Spectroscopy, IEEE Trans. Nucl. Sci., NS-29, No. 1, 619 (1982).
3. F.S. Goulding, Pulse Shaping in Nuclear Amplifiers: A Physical Approach to Noise Analysis, Nucl. Inst. and Methods 100, 493 (1972).
4. F.S. Goulding, D.A. Landis, Signal Processing for Semiconductor Detectors, (IEEE Nucl. Sci. Symp. Short Course) IEEE Trans. on Nucl. Sci., NS-29, No. 3, 1125 (1982).