Transistor reset preamplifier for high rate high resolution spectroscopy

IEEE Transactions on Nuclear Science

Volumn 29, Issue 1, 1982, Pages 619-624

  Landis, D A ^a   Cork, C P ^a   Madden, N W ^a   Goulding, F S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS; SEMICONDUCTOR DEVICES; SPECTROMETERS;

TRANSISTORS, FIELD EFFECT;

EID: 0019525391     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4335922     Document Type: Article

References (6)

1. K. Kendiah, A. Stirling, Semiconductor Nuclear-Particle Detector and Circuits. National Academy of Sciences Publications 15943, 495 (1969).
2. D.A. Landis, F.S. Goulding, and B. V. Jarrett, “Some Aspects of X-ray Fluorescence Spectrometers for Trace Element Analysis”, Nucl. Instr. and Methods, 101, 127-135 (1972).
3. K. Kandiah and G. White, Status at Harwell of Optoelectronic and Time-Variant Signal Processing for High Performance Nuclear Spectrometry with Semiconductor Detectors, IEEE Trans on Nucl. Sci., NS-28, No. 1, 613-620, (1981).
4. D.A. Landis, F.S. Goulding, R.H. Pehl, and J. T. Walton, “Pulsed Feedback Techniques for Semiconductor Detector Radiation Spectrometers”, IEEE Trans. Nucl. Sci., NS-18, No. 1, 115 (1971).
5. D.A. Landis, N.W. Madden, and F.S. Goulding, “Energy-Dependent Losses in Pulsed Feedback Preamplifiers”, IEEE Trans. Nucl. Sci., NS-26XS, No. 1, 428 (1979).
6. V. Radeka, “Overload Recovery Circuit for Charge Amplifiers”, IEEE Trans. Nucl. Sci., NS-17, No. 1, 269 (1970).