The Effects of Races, Delays, and Delay Faults on Test Generation

IEEE Transactions on Computers

Volumn C-23, Issue 10, 1974, Pages 1078-1092

  Breuer, Melvin A ^a,b  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

^b RAYTHEON COMPANY   (United States)

Author keywords

Asynchronous circuits; delay faults; dynamic tests; fault detection; modeling; races; test generation

Indexed keywords

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0016117694     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/T-C.1974.223808     Document Type: Article

References (13)

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