Heat transfer from localized absorbing defects to the host coating material in HfO2/SiO2 multilayer systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2966, Issue , 1997, Pages 283-291

  Papernov, Semyon ^a   Schmid, Ansgar W ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Finite element analysis; Heat transfer; Localized absorbing defects

Indexed keywords

DEFECTS; ENERGY TRANSFER; HAFNIUM COMPOUNDS; HEAT EXCHANGERS; HEAT TRANSFER; LASER DAMAGE; LASERS; MULTILAYERS; OPTICAL MATERIALS; PLATING; SILICON COMPOUNDS; THERMOANALYSIS;

COATING MATERIALS; DAMAGE FEATURES; DAMAGE INITIATIONS; DAMAGE MORPHOLOGIES; DRIVING MECHANISMS; FINITE-ELEMENT ANALYSIS; FORCE MICROSCOPIES; HIGH RESOLUTIONS; LENGTH SCALES; LOCALIZED ABSORBING DEFECTS; MULTILAYER SYSTEMS; PEAK TEMPERATURES; RADIATIVE ENERGY TRANSFERS; TEMPERATURE VALUES; TRANSFER MECHANISMS;

FINITE ELEMENT METHOD;

EID: 0013313535     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.274258     Document Type: Conference Paper

References (5)

1. S. Papernov, A. W. Schmid, J. Anzelotti, D. Smith, Z. R. Chrzan, "AFM-mapped, nanoscale, absorber-driven laser damage in UV high-reflector multilayers," in Laser-Induced Damage in Optical Materials: 1995, edited by H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, Vol. 2714, pp. 384-392, SPIE, Bellingham, WA, 1996.
2. ANSYS, Inc., P.O. Box 65, Johnson Road, Houston, PA 15342-0065.
3. I. Barin and O. Knacke, Thermochemical Properties of Inorganic Substances, Springer-Verlag, Berlin, 1973.
4. Yu. K. Danileiko, A. A. Manenkov, and V. S. Nechitailo, "The mechanism of laser-induced damage in transparent materials, caused by thermal explosion of absorbing inhomogeneities," Sov. J. Quantum Electron. 8 (1), 116-118 (1978).
5. J. Dijon, J. Hue, A. Disgecmez, E. Quesnel, and B. Rolland, "Thin films laser damage mechanisms at the YAG third harmonic," in Laser-Induced Damage in Optical Materials: 1995, edited by H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, Vol. 2714, pp. 416-419, SPIE, Bellingham, WA, 1996.