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Volumn 66, Issue SUPPL. 1, 1998, Pages
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In situ scanning probemicroscopy investigations of electroactive films
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
CHARGE CAPACITIES;
DIMENSIONAL CHANGES;
ELECTROACTIVE FILM;
ELECTROCHEMICAL ENVIRONMENTS;
IN-SITU;
INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPIES;
INTERMITTENT-CONTACTS;
IRIDIUM OXIDES;
MEASURING TECHNIQUE;
NICKEL HYDROXIDES;
POLYANILINE FILM;
REDOX PROCESS;
SCANNING TUNNELING MICROSCOPY (STM);
SOFT FILM;
SURFACE MODIFICATION;
ATOMIC FORCE MICROSCOPY;
ELECTROCHEMICAL OXIDATION;
IRIDIUM;
IRIDIUM COMPOUNDS;
NICKEL ALLOYS;
NICKEL OXIDE;
POLYANILINE;
SCANNING TUNNELING MICROSCOPY;
OXIDE FILMS;
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EID: 0013151170
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051187 Document Type: Article |
Times cited : (17)
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References (24)
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