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Volumn 66, Issue SUPPL. 1, 1998, Pages

In situ scanning probemicroscopy investigations of electroactive films

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CHARGE CAPACITIES; DIMENSIONAL CHANGES; ELECTROACTIVE FILM; ELECTROCHEMICAL ENVIRONMENTS; IN-SITU; INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPIES; INTERMITTENT-CONTACTS; IRIDIUM OXIDES; MEASURING TECHNIQUE; NICKEL HYDROXIDES; POLYANILINE FILM; REDOX PROCESS; SCANNING TUNNELING MICROSCOPY (STM); SOFT FILM; SURFACE MODIFICATION;

EID: 0013151170     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051187     Document Type: Article
Times cited : (17)

References (24)
  • 6
    • 73149110350 scopus 로고
    • Ph.D. Thesis, University of Bern
    • R. Nyffenegger: Ph.D. Thesis, University of Bern (1994)
    • (1994)
    • Nyffenegger, R.1
  • 20
    • 73149124010 scopus 로고
    • Ph.D. Thesis No. 11216, Federal Institute of Technology, Zurich
    • A.R. Schreyer: Ph.D. Thesis No. 11216, Federal Institute of Technology, Zurich (1995)
    • (1995)
    • Schreyer, A.R.1
  • 22
    • 0002577401 scopus 로고
    • ed. by R. Wiesendanger, H.J. Güntherodt (Springer, Berlin)
    • H. Siegenthaler: In Scanning Tunneling Microscopy II, ed. by R. Wiesendanger, H.J. Güntherodt (Springer, Berlin 1992) pp. 7-49
    • (1992) Scanning Tunneling Microscopy , vol.2 , pp. 7-49
    • Siegenthaler, H.1
  • 24
    • 73149096685 scopus 로고    scopus 로고
    • ed. by G. Jerkiewicz, M.P. Soriaga, K. Uosaki, A. Wieckowski (ACS Symposium Series 656, Washington, DC)
    • P. Forrer, G. Repphun, E. Schmidt, H. Siegenthaler: In Solid-liquid electrochemical interface, ed. by G. Jerkiewicz, M.P. Soriaga, K. Uosaki, A. Wieckowski (ACS Symposium Series 656, Washington, DC 1996) pp. 210-235
    • (1996) Solid-liquid Electrochemical Interface , pp. 210-235
    • Forrer, P.1    Repphun, G.2    Schmidt, E.3    Siegenthaler, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.