X-ray diffraction investigation of the low temperature thermal expansion of porous silicon

Journal of Applied Physics

Volumn 87, Issue 5, 2000, Pages 2131-2136

  Faivre, C ^a   Bellet, D ^a,b   Dolino, G ^a  

^a UNIV GRENOBLE ALPES   (France)

^b Grenoble INP Phelma   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013088385     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372151     Document Type: Article

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