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Volumn 77, Issue 26, 2000, Pages 4316-4318

Strong interface-induced changes on the numerical calculated Raman scattering in Si/3C-SiC superlattices

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013054636     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1328763     Document Type: Article
Times cited : (3)

References (14)
  • 3
    • 0028447880 scopus 로고
    • and references therein
    • R. F. Davis, G. Keiner, M. Shur, J. W. Palmour, and J. A. Edmond, Proc. IEEE 79, 677 (1991); M. Ruff, H. Mitlehner, and R. Heibig, IEEE Trans. Electron Devices 41, 1040 (1994), and references therein.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 1040
    • Ruff, M.1    Mitlehner, H.2    Heibig, R.3
  • 5
    • 0000180215 scopus 로고    scopus 로고
    • K. T. Tsen, J. Raman Spectrosc. 27, 277 (1996); K. T. Tsen, D. J. Smith. S. C. Y. Tsen, N. S. Kumar, and H. Morkoç, J. Appl. Phys. 70, 418 (1991).
    • (1996) J. Raman Spectrosc. , vol.27 , pp. 277
    • Tsen, K.T.1
  • 13
    • 36049060168 scopus 로고
    • D. W. Feldman, J. Parker, W. Choyke, and L. Patrick, Phys. Rev. 173, 787 (1968); 170, 698 (1968).
    • (1968) Phys. Rev. , vol.170 , pp. 698


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.