Correlation method of circuit-performance and technology fluctuations for improved design reliability

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 2001-January, Issue , 2001, Pages 39-44

  Miyawaki, D ^a   Matsumoto, S ^a   Mattausch, H J ^a   Ooshiro, S ^a   Suetake, M ^a   Miura Mattausch, M ^a   Kumashiro, S ^b   Yamaguchi, T ^b   Yamashita, K ^b   Nakayama, N ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER   (Japan)

Author keywords

Circuit simulation; Circuit testing; CMOS technology; Correlation; Fluctuations; MOSFET circuits; Proposals; Semiconductor device measurement; Semiconductor device modeling; Voltage

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; CORRELATION METHODS; DESIGN; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUIT MANUFACTURE; MOSFET DEVICES; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES;

CIRCUIT TESTING; CMOS TECHNOLOGY; FLUCTUATIONS; MOSFET CIRCUITS; PROPOSALS; SEMICONDUCTOR DEVICE MEASUREMENTS;

CIRCUIT SIMULATION;

EID: 0012791746     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2001.913278     Document Type: Conference Paper

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