Characterization of interface charge at Ga0.52In0.48P/GaAs junctions using current-voltage and capacitance-voltage measurements

Applied Physics Letters

Volumn 69, Issue 11, 1996, Pages 1599-1601

  Lim, T H ^a   Miller, T J ^a,b   Williamson, F ^a   Nathan, M I ^a  

^a University of Minnesota   (United States)

^b Photonics Research Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012566471     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117043     Document Type: Article

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