Characterization of the inverted Ga0.52In0.48P/GaAs (001) junctions using current-voltage and capacitance-voltage measurements

Applied Physics Letters

Volumn 74, Issue 5, 1999, Pages 720-722

  Cai, C ^a   Nathan, M I ^a   Lim, T H ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012564752     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123102     Document Type: Article

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