Enhanced tunnel current through thin oxide due to single-defect scattering

Applied Physics Letters

Volumn 78, Issue 4, 2001, Pages 486-488

  Fu, Y ^a   Willander, M ^a   Lundgren, P ^a   Aderstedt, E ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012422725     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1338958     Document Type: Article

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