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Volumn 6, Issue 10, 1997, Pages 1467-1471
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Anisotropic oxidation of silicon carbide
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Author keywords
Rutherford backscattering spectrometry; Silicon carbide; Thermal oxidation; Transmission electron microscopy
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Indexed keywords
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EID: 0012343125
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(97)00077-0 Document Type: Article |
Times cited : (12)
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References (6)
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