Multilayer coatings for narrow-band imaging in the extreme ultraviolet

Applied Optics

Volumn 40, Issue 7, 2001, Pages 1126-1131

  Larruquert, Juan I ^a,b   Keski Kuha, Ritva A M ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Consejo Superior de Investigaciones Científicas   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; DEGRADATION; IMAGING TECHNIQUES;

MULTILAYER COATINGS;

ULTRAVIOLET RADIATION;

EID: 0012157949     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001126     Document Type: Article

References (10)

1. J. Edelstein, “Reflection/suppression coatings for the 9001200 radiation,” in X-ray/EUV Optics for Astronomy and Microscopy,” R. B. Hoover, ed., Proc. SPIE 1160, 19-25 (1989).
2. J. F. Seely and W. R. Hunter, “Thin film interference optics for imaging the O II 834-A airglow,” Appl. Opt. 30, 2788-2794 (1991).
3. + ions,” Opt. Eng. 33, 409-413 (1994).
4. E. Spiller, Soft X-Ray Optics (Society for Photo-Optical Instrumentation Engineering, Bellingham, Wash., 1994), p. 184.
5. J. H. Weaver, C. Krafka, D. W. Lynch, and E. E. Koch, Physik Daten- Optical Properties of Metals (Fachinformationszentrum, Karlsruhe, 1981), Vol. 18-1.
6. J. I. Larruquert and R. A. M. Keski-Kuha, unpublished data.
7. E. D. Palik, Handbook ofOptical Constants ofSolids (Academic, San Diego, Calif., 1985).
8. 2Si, and InSb and evaporated Cr,” Appl. Opt. 39, 2772-2781 (2000).
9. J. F. Osantowski, “Reflectance and optical constants for Cer-Vit from 250 to 1050 A,” J. Opt. Soc. Am. 64, 834-838 (1974).
10. J. I. Larruquert and R. A. M. Keski-Kuha, “Reflectance measurements and optical constants in the extreme ultraviolet of thin films of ion-beam-deposited carbon,” Opt. Commun. 183, 437-443 (2000).