Current induced drift mechanism in amorphous SiNx:H thin film diodes

Applied Physics Letters

Volumn 65, Issue 23, 1994, Pages 2978-2980

  Shannon, J M ^a   Deane, S C ^a   McGarvey, B ^a   Sandoe, J N ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

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EID: 0012088327     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.112482     Document Type: Article

References (20)