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Journal De Physique. IV : JP

Volumn 8, Issue 5, 1998, Pages 407-412

Caractérisation et spéciation chimique à l'échelle micrométrique utilisant le rayonnement synchrotron

(4) Chevallier, P a Firsov, A b Populus, P a Legrand, F a

a CEA SACLAY (France)

b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011734901 PISSN: 11554339 EISSN: None Source Type: Conference Proceeding
DOI: 10.1051/jp4:1998551 Document Type: Article

Times cited : (3)

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