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Volumn 73, Issue 8, 1998, Pages 1077-1079

Stress-related interdiffusion in dc sputtered TiN/B-C-N multilayers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0011733432     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122089     Document Type: Article
Times cited : (7)

References (20)
  • 2
    • 21544473733 scopus 로고
    • in edited by T. D. Nguyen, B. M. Lairson, B. M. Clemens, S.-C. Shin, and K. Sato Material Research Society, Pittsburgh
    • A. L. Greer, in Structure and Properties of Multilayered Thin Films, edited by T. D. Nguyen, B. M. Lairson, B. M. Clemens, S.-C. Shin, and K. Sato (Material Research Society, Pittsburgh, 1995), p. 9.
    • (1995) Structure and Properties of Multilayered Thin Films , pp. 9
    • Greer, A.L.1
  • 16
    • 21544443774 scopus 로고    scopus 로고
    • At 600°C, the compressive stress decreased from -2000 to -200 MPa in 15 min; (unpublished)
    • At 600°C, the compressive stress decreased from -2000 to -200 MPa in 15 min; S. Fayeulle and M. Nastasi (unpublished).
    • Fayeulle, S.1    Nastasi, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.