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Volumn 84, Issue 4, 1998, Pages 584-588

Determination of the porosity of uniform films by the adsorption-ellipsometric method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0011506279     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (16)
  • 7
    • 0004236185 scopus 로고
    • Moscow: Mir
    • Azzam, R, and Bashara, N.M., Ellipsometry and Polarized Light, New York: Elsevier, 1977. Translated under the title Ellipsometriya i polyarizovannyi svet, Moscow: Mir, 1981.
    • (1981) Ellipsometriya i Polyarizovannyi Svet
  • 9
    • 0001370233 scopus 로고
    • Abeles, F., Ann. Phys., 1950, no. 5, pp. 596-640; 706-782.
    • (1950) Ann. Phys. , Issue.5 , pp. 596-640
    • Abeles, F.1
  • 15
    • 0004002507 scopus 로고
    • New York: Elsevier
    • Adamson, A.W., Physical Chemistry of Surfaces, New York: Elsevier, 1977. Translated under the title Fizicheskaya khimiya poverkhnostei, Moscow: Mir, 1979.
    • (1977) Physical Chemistry of Surfaces
    • Adamson, A.W.1
  • 16
    • 0004112841 scopus 로고
    • Moscow: Mir
    • Adamson, A.W., Physical Chemistry of Surfaces, New York: Elsevier, 1977. Translated under the title Fizicheskaya khimiya poverkhnostei, Moscow: Mir, 1979.
    • (1979) Fizicheskaya Khimiya Poverkhnostei


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.