Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry

Applied Optics

Volumn 40, Issue 8, 2001, Pages 1201-1206

  Xian, Tao ^a   Su, Xianyu ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; LIGHTING; MODULATION; OPTICAL SYSTEMS; PROFILOMETRY;

PHASE-MEASURING PROFILOMETRY (PMP);

DIFFRACTION GRATINGS;

EID: 0011304762     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001201     Document Type: Article

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