Time-resolved Extended X-ray Absorption Fine Structure (EXAFS) studies by means of an energy dispersive spectrometer

Journal of the Chinese Chemical Society

Volumn 48, Issue 2, 2001, Pages 127-132

  Oulianov, Dmitri A ^a   Tomov, Ivan V ^a   Lin, Sheng H ^b   Rentzepis, Peter M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

Author keywords

EXAFS; Time resolved; Transient structure

Indexed keywords

EID: 0010643549     PISSN: 00094536     EISSN: None     Source Type: Journal    
DOI: 10.1002/jccs.200100023     Document Type: Review

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