Positive sample bias effect in scanning tunneling microscope imaging of low coverage alkali metal atoms on Si(111)7×7 surface

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 5, 1998, Pages 2894-2897

  Eitle, J ^a,b   Gorelik, D ^a   Aloni, S ^a   Margalit, T ^a   Meyler, D ^a   Haase, G ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010452394     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590290     Document Type: Article

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