Detection limits of an internal-reflection sensor for the optical beam deflection method

Applied Optics

Volumn 36, Issue 19, 1997, Pages 4456-4462

  García Valenzuela, Augusto ^a   Diaz Uribe, Rufino ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Critical angle; Internal reflection; Optical beam deflection; Sensors

Indexed keywords

EID: 0009988114     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.004456     Document Type: Article

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