Defects in thermal oxide studied by photoluminescence spectroscopy

Applied Physics Letters

Volumn 75, Issue 9, 1999, Pages 1219-1221

  Nishikawa, Hiroyuki ^a   Stathis, James H ^b   Cartier, E ^b  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009771657     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124647     Document Type: Article

References (13)

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