A characterization technique for quantum well infrared photodetectors

Applied Physics Letters

Volumn 75, Issue 20, 1999, Pages 3210-3212

  Chen, C J ^a   Choi, K K ^a,b   Rokhinson, L ^a   Chang, W H ^a,b   Tsui, D C ^a  

^a Princeton University   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009732499     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125280     Document Type: Article

References (6)

1. D. A. Fulghum, Aviat. Week Space Technol., Feb. 3, p. 30 (1997).
2. H. Kaplan, Photonics Spectra, June, p. 104 (1999).
3. C. J. Chen, K. K. Choi, W. H. Chang, and D. C. Tsui, Appl. Phys. Lett. 71, 3045 (1997).
4. C. J. Chen, K. K. Choi, W. H. Chang, and D. C. Tsui, Appl. Phys. Lett. 72, 7 (1998).
5. C. J. Chen, K. K. Choi, L. Rohkinson, W. H. Chang, and D. C. Tsui, Appl. Phys. Lett. 74, 862 (1999).
6. A. C. Goldberg, J. W. Little, S. W. Kennerly, D. W. Beekman, and R. P. Leavitt, Proceedings of the 6th International Workshop on Long Wavelength Infrared Detectors and Arrays, edited by Li, Liu, Tidrow, and Gunapala (The Electrochemical Society, Pennington, NJ, 1998), Vol. 98-21, pp. 122-133.