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Volumn 138-139, Issue 1-4, 1999, Pages 199-205

A new process to manufacture thin SiGe and SiGeC epitaxial films on silicon by ion implantation and excimer laser annealing

Author keywords

Carbon; Epitaxy; Excimer laser; Germanium; Implantation; Silicon

Indexed keywords


EID: 0009722696     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00399-7     Document Type: Article
Times cited : (8)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.