Electrically detected magnetic resonance signal from iron contaminated Czochralski silicon crystal

Journal of Applied Physics

Volumn 83, Issue 8, 1998, Pages 4042-4048

  Mchedlidze, T ^a   Matsumoto, K ^a  

^a Komatsu Electronic Metals Co Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009650704     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367160     Document Type: Article

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