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Volumn 16, Issue 4, 1998, Pages 2121-2124
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Perturbation solution for the interfacial oxidation of silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0009447895
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.590140 Document Type: Article |
Times cited : (8)
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References (7)
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