Selective Cu-atom transportation from a tip of scanning tunneling microscope onto an Ag(110) surface by chemical reaction

Applied Physics Letters

Volumn 70, Issue 25, 1997, Pages 3371-3373

  Okawa, Y ^a   Tanaka, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009325888     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119174     Document Type: Article

References (15)

1. G. Ertl, Angew. Chem. 102, 1258 (1990); F. M. Chua, Y. Kuk, and P. J. Silverman, Phys. Rev. Lett. 63, 386 (1989); F. Jensen, F. Besenbacher, E. Lægsgaard, and I. Stensgaard, Phys. Rev. B 41, 10 233 (1990).
2. G. Ertl, Angew. Chem. 102, 1258 (1990); F. M. Chua, Y. Kuk, and P. J. Silverman, Phys. Rev. Lett. 63, 386 (1989); F. Jensen, F. Besenbacher, E. Lægsgaard, and I. Stensgaard, Phys. Rev. B 41, 10 233 (1990).
3. G. Ertl, Angew. Chem. 102, 1258 (1990); F. M. Chua, Y. Kuk, and P. J. Silverman, Phys. Rev. Lett. 63, 386 (1989); F. Jensen, F. Besenbacher, E. Lægsgaard, and I. Stensgaard, Phys. Rev. B 41, 10 233 (1990).
4. T. Hashizume, M. Taniguchi, K. Motai, H. Lu, K. Tanaka, and T. Sakurai, Jpn. J. Appl. Phys. 2 30, L1529 (1991); M. Taniguchi, K. Tanaka, T. Hashizume, and T. Sakurai, Surf. Sci. 262, L123 (1992).
5. T. Hashizume, M. Taniguchi, K. Motai, H. Lu, K. Tanaka, and T. Sakurai, Jpn. J. Appl. Phys. 2 30, L1529 (1991); M. Taniguchi, K. Tanaka, T. Hashizume, and T. Sakurai, Surf. Sci. 262, L123 (1992).
6. L. Eierdal, F. Besenbacher, E. Laegsgaad, and I. Stensgaad, Ultramicroscopy 42-44, 505 (1992).
7. K. Tanaka, Jpn. J. Appl. Phys. 1 32, 1389 (1993).
8. Y. Matsumoto, Y. Okawa, and K. Tanaka, Surf. Sci. 325, L435 (1995); 336, L762 (1995).
9. Y. Matsumoto, Y. Okawa, and K. Tanaka, Surf. Sci. 325, L435 (1995); 336, L762 (1995).
10. R. S. Becker, J. A. Golovchenko, and B. S. Swartzentruber, Nature (London) 325, 419 (1987).
11. D. M. Bigler and E. K. Schweizer, Nature (London) 344, 524 (1990).
12. See for instance, C. Bai, Scanning Tunneling Microscopy and its Application, Springer Series in Surface Sciences (Shanghai Scientific & Technical Publishers and Springer, Berlin, 1995), Vol. 32, pp. 277-377; C. T. Sailing, J. Vac. Sci. Technol. B 14, 1322 (1996), and references therein.
13. See for instance, C. Bai, Scanning Tunneling Microscopy and its Application, Springer Series in Surface Sciences (Shanghai Scientific & Technical Publishers and Springer, Berlin, 1995), Vol. 32, pp. 277-377; C. T. Sailing, J. Vac. Sci. Technol. B 14, 1322 (1996), and references therein.
14. Y. Okawa and K. Tanaka, Surf. Sci. 344, L1207 (1995); I. Stensgaard, E. Lægsgaard, and F. Besenbacher, J. Chem. Phys. 103, 9825 (1995).
15. Y. Okawa and K. Tanaka, Surf. Sci. 344, L1207 (1995); I. Stensgaard, E. Lægsgaard, and F. Besenbacher, J. Chem. Phys. 103, 9825 (1995).