X-ray emission for Ar ions impacting on SiO2

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 31, Issue 23, 1998, Pages 5117-5122

  Lehnert, U ^a   Stockli M P ^a   Cocke, C L ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ELECTRON ENERGY LEVELS; EMISSION SPECTROSCOPY; FLUORESCENCE; SILICA; X RAY SPECTROSCOPY;

VACANCY TRANSFER;

ION BEAMS;

EID: 0009306257     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/31/23/009     Document Type: Article

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