X-ray emission for 3-137 keV Ar17+ impacting SiO2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 124, Issue 2-3, 1997, Pages 431-434

  Takacs E ^a   Onodi Szucs Z ^a   Ratliff, L P ^b   Gillaspy, J D ^b   Palinkas J ^a  

^a UNIVERSITY OF DEBRECEN   (Hungary)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CHARGE TRANSFER; ELECTRON ENERGY LEVELS; ION BEAMS; SILICA; SILICON; X RAY SPECTROSCOPY; X RAYS;

ELECTRON TRANSFER; X RAY EMISSION;

ELECTROMAGNETIC WAVE EMISSION;

EID: 0042629650     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)01054-3     Document Type: Article

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