Cu-Ni Thin Films Electrodeposited on Si: Composition and Current Efficiency

Physica Status Solidi (A) Applied Research

Volumn 187, Issue 1, 2001, Pages 91-95

  Sartorelli, M L ^a   Schervenski, A Q ^a   Delatorre, R G ^a   Klauss, P ^a   Maliska, A M ^a   Pasa, A A ^a  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009291236     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200109)187:1<91::AID-PSSA91>3.0.CO;2-9     Document Type: Article

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4. L. SELIGMAN, M. L. SARTORELLI, A. A. PASA, W. SCHWARZACHER, and O. I. KASYUTICH, J. Magn. Magn. Mater. 226-230, 752 (2001).
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6. W. K. CHU, J. W. MAYER, and M. A. NICOLET, Backscattering Spectrometry, Academic Press, New York 1978.